Objective:

• use the principal methods of material characterization adjusted and optimized for the surface, nanomaterials and nanostructure studies, 
• analyze the information accessible through the different physical techniques,
• describe the potentials and the technique limitations.

Public:

Ingeneers or senior technician:

• working in the field of micro and nanotechnologies in public or industrial laboratories,
• faced with problem solving related to the nanoscale control of the material properties during their production and/or their integration into devices.

Content:

Following a basic technique recall used for the material characterization from a physical-chemical point of view, a particular light will be given in the case of surfaces, nanomaterials and nanostructures. The principles, the instrumental variations, the limits and the complementarities with other techniques will be developped. Each technique will be the subject of a detailed presentation - modus operandi and fields of application - illustrated by a demonstration.

Studied techniques:

• Auger electron spectroscopy (AES) and X-ray and UV photoelectron spectroscopy (XPS-UPS),
• scanning probe microscopy (SPM),
• X-ray diffration (XRD),
• spectroscopic ellipsometry (SE),
• Fourier transform infrared spectroscopy (FTIR),
• secondary ion mass spectrometry (SIMS),
• Rutherford backscattering spectrometry (RBS),
• scanning electron microscopy (SEM),
• transmission electron microscopy (TEM),
• sample preparations.