Atomic Force Microscopy (AFM).
The most commonly used techniques are :
- Scanning Electronic Microscopy (SEM),
- Transmission Electronic Microscopy (TEM),
- Atomic Force Microscopy (AFM).
Activity phases
How to differentiate “nano” working situations?
The types of "nanomaterial" working situations are characterized by the state of particles during the considered phase and the level of integration of nano-objects on the surface or inside the volume. For each, different phases of activity take place successively: Storing/Warehousing, Loading/Unloading, Characterization, Production/Transformation, Maintenance/Cleanliness, Packaging/Transport.