SEM characterization workstation.
Scanning Electronic Microscopy (SEM) provides information on the morphology of the tubes, while Transmission Electronic Microscopy (TEM) specifies the layout of the crystalline structure. Atomic Force Microscopy (AFM) provides indications as to the electrical conductivity of a nanostructure perpendicular to the support, or the topography of the structure in the case of tubes that are detached and deposited on a surface. Poor handling of the AFM tip can damage the structures and lead to the scattering of several nanoparticles.